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7 products
| IMAGE | PART NO. | PRICE | QUANTITY | STOCK | MANUFACTURE | DESCRIPTION | Series | Part Status | Packaging | Operating Temperature | Mounting Type | Package / Case | Supplier Device Package | Supply Voltage | Number of Bits | Logic Type | |
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1,958
Ships today + free overnight shipping
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Texas Instruments | IC SCAN TEST DEVICE 28SOIC | 74ABT | Obsolete | Cut Tape (CT) | -40°C ~ 85°C | Surface Mount | 28-SOIC (0.295", 7.50mm Width) | 28-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Registered Bus Transceiver | |||
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1,328
Ships today + free overnight shipping
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Texas Instruments | IC SCAN TEST DEV W/OBT 24-SOIC | 74ABT | Active | Cut Tape (CT) | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 8 | Scan Test Device with Bus Transceivers | |||
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3,459
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Texas Instruments | IC ADDRESSABLE SCAN PORT 24-SOIC | 74ABT | Obsolete | Cut Tape (CT) | -40°C ~ 85°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC | 4.5 V ~ 5.5 V | 10 | Addressable Scan Ports | |||
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848
Ships today + free overnight shipping
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Texas Instruments | IC ADDRESSABLE SCAN PORT 24TSSOP | 74ABT | Obsolete | Cut Tape (CT) | -40°C ~ 85°C | Surface Mount | 24-TSSOP (0.173", 4.40mm Width) | 24-TSSOP | 4.5 V ~ 5.5 V | 10 | Addressable Scan Ports | |||
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3,954
Ships today + free overnight shipping
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Texas Instruments | IC SCAN-TEST-DEV/TXRX 56-TSSOP | 74ABT | Obsolete | Cut Tape (CT) | -40°C ~ 85°C | Surface Mount | 56-TFSOP (0.240", 6.10mm Width) | 56-TSSOP | 4.5 V ~ 5.5 V | 18 | Scan Test Device with Inverting Bus Transceivers | |||
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773
Ships today + free overnight shipping
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Texas Instruments | IC SCAN-TEST-DEV/TXRX 56-TSSOP | 74ABT | Active | Cut Tape (CT) | -40°C ~ 85°C | Surface Mount | 56-TFSOP (0.240", 6.10mm Width) | 56-TSSOP | 4.5 V ~ 5.5 V | 18 | Scan Test Device with Bus Transceivers | |||
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1,762
Ships today + free overnight shipping
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Texas Instruments | IC SCAN-TEST-DEV/TXRX 56-SSOP | 74ABT | Active | Cut Tape (CT) | -40°C ~ 85°C | Surface Mount | 56-BSSOP (0.295", 7.50mm Width) | 56-SSOP | 4.5 V ~ 5.5 V | 18 | Scan Test Device with Bus Transceivers |
